montena technology sa
Route de Montena 89
1728 Rossens
Switzerland
Tel. +41 26 411 84 84
Fax +41 26 411 17 79
Montena makes PCI generators for tests according to MIL-STD-188-125 1 / 2. Pulse current injections (PCI) acceptance testing is used to demonstrate that electrical Point Of Entry (POE) protective devices perform in accordance with the transient suppression / attenuation requirements.
The PCI tests require high energy generators for delivering current pulses either directly or through coupling devices in the cables.
The short pulse test is covered with two generators, PPG-E1-1200 for current pulses up to 1.2 kA and EMP300K-5-500 for 1.5 kA up to 5 kA pulses. Additionally montena proposes a lower level pulse generator (EMP10K-5-500) for tests on electronic components.
The intermediate pulse test requires a generator delivering up to 260 A.
RF antenna line POE must be tested up to 400 A. Montena proposes two “charge line” generators for testing the susceptibility of those antenna ports. A set of charge line plugs of different lengths are supplied in order to generate frequencies in the specified range.
Each generator is fully configurable, with current adjustable output, manual or remote control.
All designs can be adapted to the customer’s requirements, to fulfil other standards. Montena also supplies all accessories such as inductive and capacitive couplers, isolation devices, termination loads, control and data acquisition software applications.
REFERENCE | SHORT CIRCUIT CURRENT | CHARGING VOLTAGE | SPECIFICATIONS |
PPG-E1-1200 | 50 A to 1.2 kA | 80 kV | High current PCI short pulse, rise time < 20ns, duration = 500 ns |
EMP300K-5-500 | 1.5 kA to 5 kA | 350 kV | |
IPP3K-4MS | 3 to 260 A | 3 kV | PCI intermediate pulse, rise time < 1.5µs, duration = 3 - 5 ms |
CLP40K | 4 to 400 A | 25 kV | Charge line pulser, 50 Ω output, 10 test frequencies up to ~250 MHz |
CLP5K | 0 to 50 A | 5 kV | Charge line pulser, 50 Ω Type-N output, 11 test freq. up to 477.5 MHz |
EMP10K-5-500 | 3 to 200 A | 10 kV | PCI short pulse for tests of electronic components |